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Psychometrics for educational debates / edited by Leo J. Th. van der Kamp, Willem F. Langerak, and Dato N. M. de Gruijter.

LIBRA LB3051 .I515 1977
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Format:
Book
Conference/Event
Contributor:
Kamp, Leo J. Th. van der.
Langerak, Willem F.
Gruijter, Dato N. de.
Conference Name:
International Symposium on Educational Testing, 3d, Leyden, 1977.
Language:
English
Subjects (All):
Educational tests and measurements--Congresses.
Educational tests and measurements.
Genre:
Conference papers and proceedings.
Physical Description:
x, 337 pages : illustrations ; 24 cm
Place of Publication:
Chichester ; New York : Wiley, [1980]
Notes:
"Proceedings of the Third International Symposium on Educational Testing, held in Leyden, The Netherlands, June 27-30, 1977."
Includes bibliographies and indexes.
ISBN:
0471275964
OCLC:
4804705

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