Nanoscale processes on insulating surfaces / Enrico Gnecco, Marek Szymonski.

Format:

Book

Author/Creator:

Gnecco, Enrico.

Contributor:

Szymoński, Marek.

Language:

English

Subjects (All):

Scanning probe microscopy.

Atomic force microscopy.

Physical Description:

xiv, 186 pages : illustrations ; 24 cm

Place of Publication:

Singapore ; Hackensack, NJ : World Scientific, [2009]

Summary:

Gnecco (U. of Basel, Switzerland) and Szymonksi (Jagiellonian U., Poland) begin by describing the crystallographic structures and preparation methods of various insulating surfaces, limiting their consideration to alkali halide surfaces and to oxide surfaces with large band gaps. Then they introduce the imaging techniques scanning tunneling microscopy (STM) and more especially atomic force microscopy (AFM), which can identify and characterize features on the surfaces at the nanometer scale. Finally, they explain some of the features so identified and how to modify them. They cover scanning probe microscopy in ultra high vacuum, bulk insulating surfaces, and thin insulating films; the interaction of ions, electrons, and photons with halide surfaces; surface patterning with electrons, photons, and ions; and metal deposition, organic molecules, scanning probe spectroscopy, nano-tribology, and nano-manipulation on insulating surfaces. Annotation ©2010 Book News, Inc., Portland, OR (booknews.com)

Notes:

Includes bibliographical references (pages 163-181) and index.

ISBN:

9789812837622

9812837620

OCLC:

290461082