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35th Applied Imagery and Pattern Recognition Workshop : AIPR 2006 : 11-13 October, 2006, Washington, D.C., USA / sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence.

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Format:
Book
Conference/Event
Contributor:
IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence.
IEEE Xplore (Online service)
Conference Name:
Applied Imagery Pattern Recognition Workshop (35th : 2006 : Washington, D.C.)
Language:
English
Subjects (All):
Optical pattern recognition--Congresses.
Optical pattern recognition.
Pattern recognition systems--Congresses.
Pattern recognition systems.
Image processing--Digital techniques--Congresses.
Image processing.
Image processing--Digital techniques.
Genre:
Conference papers and proceedings.
Physical Description:
1 volume (various pagings) : digital, PDF files, illustrations (some color
Other Title:
AIPR 2006
Title from HTML home page: Applied Imagery and Pattern Recognition Workshop, 2006, AIPR 2006, 35th IEEE
Place of Publication:
Los Alamitos, Calif. : IEEE Computer Society, [2006]
System Details:
Mode of access: World Wide Web.
text file
PDF
Notes:
Title from PDF t.p. (viewed on June 7, 2007).
"IEEE Computer Society Order Number P2739."
Includes bibliographical references.
ISBN:
0769527396
9780769527390
OCLC:
140611203
Access Restriction:
Restricted for use by site license.

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