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2006 IEEE International Workshop on Memory Technology, Design, and Testing. 2-4 August 2006, Taipei, Taiwan : proceedings / sponsored by IEEE Computer Society, Technical Council on Testing Technology (TTTC), Technical Committee on VLSI : co-sponsored by National Tsing-Hus University, Taiwan, Ministry of Education, Taiwan : in-cooperation with IEEE Circuits and Systems Society, IEEE Solid-State Circuits Society.
IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online
IEEE Xplore (IEEE/IET Electronic Library - IEL)- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE International Workshop on Memory Technology, Design, and Testing (14th : 2006 : Taipei, Taiwan)
- Language:
- English
- Subjects (All):
- Semiconductor storage devices--Testing--Congresses.
- Random access memory--Congresses.
- Random access memory.
- Semiconductor storage devices--Testing.
- Semiconductor storage devices.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xviii, 83 pages : illustrations
- Other Title:
- Also known as: MTDT '06
- Proceedings of the IEEE Workshop on Memory Technology, Design, and Testing
- Memory Technology, Design, and Testing, 2006, MTDT '06, 2006 IEEE International Workshop on.
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society, [2006]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Computer Society order number P2572"--T.p. verso.
- Includes bibliographical references and index.
- ISBN:
- 9780769525723
- 0769525725
- OCLC:
- 76168655
- Access Restriction:
- Restricted for use by site license.
- Online:
- Table of contents only
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