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AUTOTESTCON 2005. Orlando, FL, 26-29 September 2005 / IEEE.
Connect to full text Available online
View online- Format:
- Book
- Conference/Event
- Conference Name:
- Autotestcon (2005 : Orlando, Fla.)
- Language:
- English
- Subjects (All):
- Systems engineering--Congresses.
- Systems engineering.
- Electronic digital computers--Testing--Congresses.
- Electronic digital computers.
- Weapons systems--Technological innovations--Congresses.
- Weapons systems.
- Weapons systems--Technological innovations.
- Electronic digital computers--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xxvii, 867 pages : illustrations
- Other Title:
- IEEE AUTOTESTCON 2005
- Place of Publication:
- Piscataway, N.J. : IEEE Operations Center, [2005]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Catalog Number: 05CH37671"
- "Our conference theme, Technology Powering the Next Generation of Test, is reflected in our excellent technical program documented in these Proceedings"--Added t.p.
- Includes bibliographical references and author index.
- ISBN:
- 0780391012
- 9780780391017
- OCLC:
- 70224284
- Access Restriction:
- Restricted for use by site license.
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