7th International Symposium on Quality Electronic Design. ISQED 2006, proceedings : 27-29 March 2006, San Jose, California / technical sponsors, IEEE Electron Devices Society & IEEE CPTM ; cooperating entities, IEEE CASS ... [and others] ; corporate & media sponsors, Mentor Graphics .. [and others].

Format:

Book

Conference/Event

Contributor:

IEEE Xplore (Online service)

IEEE Electron Devices Society.

Components, Packaging & Manufacturing Technology Society.

IEEE Circuits and Systems Society.

Mentor Graphics (Firm)

Conference Name:

International Symposium on Quality Electronic Design (7th : 2006 : San Jose, Calif.)

Language:

English

Subjects (All):

Integrated circuits--Very large scale integration--Reliability--Congresses.

Integrated circuits.

Integrated circuits--Very large scale integration--Design and construction--Congresses.

Integrated circuits--Very large scale integration--Design and construction.

Integrated circuits--Very large scale integration--Computer-aided design--Congresses.

Integrated circuits--Very large scale integration--Computer-aided design.

Integrated circuits--Very large scale integration--Testing--Quality control--Congresses.

Integrated circuits--Very large scale integration--Testing.

Quality control.

Integrated circuits--Very large scale integration--Reliability.

Integrated circuits--Very large scale integration.

Genre:

Conference papers and proceedings.

Physical Description:

xxii, 824 pages : illustrations

Other Title:

Seventh International Symposium on Quality Electronic Design

International Symposium on Quality Electronic Design

Quality Electronic Design

ISQED 2006

Place of Publication:

Los Alamitos, Calif. : IEEE Computer Society, [2006]

System Details:

Mode of access: World Wide Web.

text file

Notes:

"IEEE Computer Society Order Number P2523"--T.p. verso.

Includes bibliographical references and author index.

ISBN:

0769525237

9780769525235

OCLC:

66386218

Access Restriction:

Restricted for use by site license.