AMUEM 2005 : proceedings of the 2005 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement : Niagara Falls, Ontario, Canada, 13 May 2005 / sponsored by the IEEE Instrumentation and Measurement Society.

Format:

Book

Conference/Event

Contributor:

Institute of Electrical and Electronics Engineers.

IEEE Instrumentation and Measurement Society.

IEEE Xplore (Online service)

Conference Name:

IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement (2005 : Niagara Falls, Ont.)

Language:

English

Subjects (All):

Uncertainty (Information theory)--Congresses.

Uncertainty (Information theory).

Measurement--Congresses.

Measurement.

Genre:

Conference papers and proceedings.

Physical Description:

vi, 124 pages : illustrations, digital, PDF files

Other Title:

Proceedings of the 2005 IEEE International Workshop on Advanced Methods for Uncertainty Estimation in Measurement

Advanced Methods for Uncertainty Estimation in Measurement, 2005, proceedings of the 2005 IEEE International Workshop on.

Place of Publication:

Piscataway, NJ : Institute of Electrical and Electronics Engineers, [2004]

System Details:

Mode of access: World Wide Web.

text file

PDF

Notes:

Includes bibliographical references and index.

Electronic reproduction. New York, N.Y. : IEEE, c2006. System requirements: Adobe Acrobat Reader. Mode of access: World Wide Web. Made available through IEEE Xplore under title: Advanced Methods for Uncertainty Estimation in Measurement, 2005, proceedings of the 2005 IEEE International Workshop on.

ISBN:

0780389808

9780780389809

OCLC:

64214227

Access Restriction:

Restricted for use by site license.