My Account Log in

2 options

Proceedings of 2006 Conference on High Density Microsystem Design and Packaging and Component Failure Analysis (HDP '06). June 27th-June 30 2006 : Shanghai University, Shanghai, China / organized by IEEE ... [and others].

Connect to full text Available online

View online

IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online

View online
Format:
Book
Conference/Event
Contributor:
IEEE Xplore (Online service)
Institute of Electrical and Electronics Engineers.
Components, Packaging & Manufacturing Technology Society.
Conference Name:
IEEE CPMT Conference on High Density Microsystem Design and Packaging and Component Failure Analysis (8th : 2006 : Shanghai, China)
Language:
English
Subjects (All):
Integrated circuits--Design and construction--Congresses.
Integrated circuits.
Integrated circuits--Design and construction.
Electronic packaging--Congresses.
Electronic packaging.
Microelectromechanical systems--Congresses.
Microelectromechanical systems.
Genre:
Conference papers and proceedings.
Physical Description:
328 pages : illustrations
Other Title:
2006 Conference on High Density Microsystem Design and Packaging and Component Failure Analysis (HDP '06)
Proceedings, HDP '06
Place of Publication:
Piscataway, NJ : IEEE, 2006.
System Details:
Mode of access: World Wide Web.
text file
Notes:
"IEEE catalog number 06EX1427"--T.p. verso.
Includes bibliographical references and index.
ISBN:
1424404886
9781424404889
1424404894
9781424404896
OCLC:
76171450
Access Restriction:
Restricted for use by site license.

The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.

Find

Home Release notes

My Account

Shelf Request an item Bookmarks Fines and fees Settings

Guides

Using the Find catalog Using Articles+ Using your account