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Proceedings of the 7th European Symposium Symposium on Reliability of Electron Devices, Failure Physics and Analysis. 8-11 October 1996, Enschede, The Netherlands / edited by Guido Groeseneken ... [and others].
- Format:
- Book
- Conference/Event
- Conference Name:
- European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (7th : 1996 : Enschede, Netherlands)
- Language:
- English
- Subjects (All):
- Electronic apparatus and appliances--Reliability--Congresses.
- Electronic apparatus and appliances.
- Electronic apparatus and appliances--Testing--Congresses.
- Integrated circuits--Reliability--Congresses.
- Integrated circuits.
- Integrated circuits--Testing--Congresses.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xii, 1603-1946, II pages : illustrations
- Other Title:
- Reliability of Electron Devices, Failure Physics and Analysis
- ESREF 96
- Place of Publication:
- Oxford ; New York : Pergamon, [1996]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "Published as a special issue of the journal Microelectronics and reliability, vol. 36, no. 11/12 (1996) and supplied to subscribers as part of their subscription"--T.p. verso.
- "Sponsored by IEEE, Electron Devices Society"--Cover.
- "IEEE catalog number 96TH8196"--T.p. verso.
- Includes bibliographical references and index.
- ISBN:
- 0780333691
- 9780780333697
- OCLC:
- 36316837
- Access Restriction:
- Restricted for use by site license.
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