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Proceedings of technical papers. 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT), April 27-29, 2005, Ambassador Hotel Hsinchu, Taiwan / [sponsored by] Industrial Technology Research Institute, IEEE, [and] TSIA.
- Format:
- Book
- Conference/Event
- Conference Name:
- International Symposium on VLSI Design, Automation, and Test (2005 : Hsin-chu shih, Taiwan)
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Congresses.
- Integrated circuits.
- Integrated circuits--Very large scale integration.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 348, ii pages : illustrations
- Other Title:
- VLSI design, automation & test
- Place of Publication:
- Hsinchu, Taiwan : ERSO/ITRI, [2005]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- Includes bibliographical references.
- ISBN:
- 0780390601
- 9780780390607
- OCLC:
- 65471641
- Access Restriction:
- Restricted for use by site license.
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