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2005 IEEE International Test Conference (ITC). 8-10 November, 2005, Austin, TX.
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View online- Format:
- Book
- Conference/Event
- Conference Name:
- International Test Conference (2005: : Austin, Texas.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Semiconductors--Testing--Congresses.
- Semiconductors.
- Semiconductors--Testing.
- Electronics--Congresses.
- Electronics.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 2 volumes (viii, 1323 pages) : illustrations
- Other Title:
- International Test Conference (ITC)
- Test Conference, 2005, proceedings, ITC 2005, IEEE International.
- Place of Publication:
- Piscataway, N.J. : Institute of Electrical and Electronics Engineers, [2005]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Catalogue Number: 05CH37661"--T.p. verso.
- Includes bibliographical references and index.
- ISBN:
- 0780390385
- 9780780390386
- OCLC:
- 64704533
- Access Restriction:
- Restricted for use by site license.
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