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Third IEEE International Workshop on Electronic Design, Test and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia / edited by Patrick Girard ... [and others] ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC) .. [and others] ; with industrial co-sponsorship from National Instruments ; in cooperation with Freescale Semiconductor Malaysia ... [and others].
Connect to full text Available online
View online- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE International Workshop on Electronic Design, Test and Applications (3rd : 2006 : Kuala Lumpur, Malaysia)
- Language:
- English
- Subjects (All):
- Electronics--Research--Congresses.
- Electronics.
- Electronics--Design--Congresses.
- Electronics--Testing--Congresses.
- Electronics--Testing.
- Design.
- Electronics--Research.
- Genre:
- Conference papers and proceedings.
- Biographies.
- Physical Description:
- xvii, 521 pages : illustrations
- Other Title:
- International Workshop on Electronic Design, Test and Applications
- Electronic Design, Test and Applications
- DELTA 2006
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society, [2006]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Computer Society Order Number P2500"--T.p. verso.
- Includes bibliographical references and index.
- ISBN:
- 0769525008
- 9780769525006
- OCLC:
- 63201884
- Access Restriction:
- Restricted for use by site license.
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