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5th International Workshop on Microprocessor Test and Verification. common challenges and solutions : proceedings : Austin, Texas, September 9-10, 2004 / sponsored by IEEE Computer Society Test Technology Technical Council (TTTC).

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Format:
Book
Conference/Event
Contributor:
IEEE Computer Society. Technical Council on Test Technology.
IEEE Xplore (Online service)
Conference Name:
International Workshop on Microprocessor Test and Verification (5th : 2004 : Austin, Tex.)
Language:
English
Subjects (All):
Microprocessors--Testing--Congresses.
Microprocessors.
Integrated circuits--Testing--Congresses.
Integrated circuits.
Integrated circuits--Verification--Congresses.
Integrated circuits--Verification.
Systems on a chip--Testing--Congresses.
Systems on a chip.
Testing.
Microprocessors--Testing.
Genre:
Conference papers and proceedings.
Physical Description:
ix, 117 pages : illustrations
Other Title:
MTV 2004
Fifth International Workshop on Microprocessor Test and Verification
Microprocessor Test and Verification
Place of Publication:
Los Alamitos, Calif. : IEEE Computer Society, 2004.
System Details:
Mode of access: World Wide Web.
text file
Notes:
"IEEE Computer Society Order Number P2320"--T.p. verso.
Includes bibliographical references and index.
ISBN:
076952320X
9780769523200
OCLC:
60692637
Access Restriction:
Restricted for use by site license.

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