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2005 IEEE International Workshop on Memory Technology, Design and Testing. MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan / IEEE Computer Society Test Technology Technical Council ; co-sponsored by National Tsing Hua University.
Connect to full text Available online
View online- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE International Workshop on Memory Technology, Design, and Testing (13th : 2005 : Taipei, Taiwan)
- Language:
- English
- Subjects (All):
- Semiconductor storage devices--Testing--Congresses.
- Semiconductor storage devices.
- Random access memory--Congresses.
- Random access memory.
- Semiconductor storage devices--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xxv, 153 pages : illustrations
- Other Title:
- MTDT 2005
- Memory technology, design and testing
- Memory Technology, Design, and Testing, 2005, MTDT 2005, 2005 IEEE International Workshop on.
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society, 2005.
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Computer Society Order Number P2313"--T.p. verso.
- Includes bibliographical references and author index.
- ISBN:
- 0769523137
- 9780769523132
- OCLC:
- 61390752
- Access Restriction:
- Restricted for use by site license.
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