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DBT 2004. 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA / edited by Sankaran Menon ... [and others] ; sponsored by IEEE Computer Society Test Technology Technical Committee.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE International Workshop on Defect Based Testing (2004 : Napa, Calif.)
- IEEE VLSI Test Symposium (2004 : Napa, Calif.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Defects--Congresses.
- Integrated circuits.
- Iddq testing--Congresses.
- Iddq testing.
- Metal oxide semiconductors, Complementary--Congresses.
- Metal oxide semiconductors, Complementary.
- Integrated circuits--Defects.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- ix, 112 pages, 1 unnumbered page : illustrations
- Other Title:
- VDSM chips and the need for defect based test
- Current & defect based testing
- Current and Defect Based Testing, 2004, DBT 2004, proceedings, 2004 IEEE International Workshop on.
- Place of Publication:
- Piscataway, N.J. : IEEE, [2004]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- 2000 workshop as: IEEE International Workshop on Defect Based Testing.
- " ... held in conjunctionwith the VLSI Test Symposium (VTS2004), in Napa, CA. The theme of this year's workshop "VDSM Chips and the Need for Defect Based Test ..."--P. v.
- "IEEE Catalog Number 04EX1004"--Cover.
- Includes bibliographical references and author index.
- ISBN:
- 0780389506
- 9780780389502
- OCLC:
- 57494416
- Access Restriction:
- Restricted for use by site license.
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