ETS 2004. Ninth IEEE European Test Symposium : proceedings : 23-26 May, 2004, Corsica, France / [sponsored by IEEE Computer Society TTTC, LIRMM].

Format:

Book

Conference/Event

Contributor:

IEEE Xplore (Online service)

IEEE Computer Society. Technical Council on Test Technology.

LIRMM.

Conference Name:

IEEE European Test Symposium (9th : 2004 : Corsica, France)

Language:

English

Subjects (All):

Integrated circuits--Testing--Congresses.

Integrated circuits.

Genre:

Conference papers and proceedings.

Physical Description:

xiv, 181 pages : illustrations, portraits

Other Title:

Test Symposium, 2004, ETS 2004, proceedings, Ninth IEEE European.

Former Title:

IEEE European Test Workshop

Place of Publication:

Los Alamitos, Calif. : IEEE Computer Society Press, [2004]

System Details:

Mode of access: World Wide Web.

text file

Contents:

Debug and Diagnosis

At-Speed On-Chip Diagnosis of Board-Level Interconnect Faults / A. Jutman 2

Analog Measurement Techniques

Accurate Tap-Delay Measurements Using a Differential Oscillation Technique / O. Petre, H. Kerkhoff 10

Delay Chain Based Programmable Jitter Generator / T. Xia, P. Song, K. Jenkins, J.-C. Lo 16

Design for Dependability

Application of Local Design-for-Reliability Techniques for Reducing Wear-out Degradation of CMOS Combinational Logic Circuits / X. Xuan, A. Chatterjee, A. Singh 24

A New Self-Checking Multiplier by Use of a Code-Disjoint Sum-Bit Duplicated Adder / D. Marienfeld, E. Sogomonyan, V. Ocheretnij, M. Gossel 30

ATE Hardware and Software

Software Development for an Open Architecture Test System / B. Parnas, A. Pramanick, M. Elston, T. Adachi 38

Timing and Delay Testing

Delay Fault Testing and Silicon Debug Using Scan Chains / R. Datta, A. Sebastine, J. Abraham 46

Manufacturing-Oriented Testing of Delay Faults in the Logic Architecture of Symmetrical FPGAs / P. Girard, O. Heron, S. Pravossoudovitch, M. Renovell 52

MEMS Testing

Electrically-Induced Thermal Stimuli for MEMS Testing / N. Dumas, F. Azais, L. Latorre, P. Nouet 60

MEMS Built

In-Self-Test Using MLS / A. Dhayni, S. Mir, L. Rufer 66

Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems / F. Su, S. Ozev, K. Chakrabarty 72

Embedded Core Testing

User-Constrained Test Architecture Design for Modular SOC Testing / L. Krundel, S. Goel, E. Marinissen, M.-L. Flottes, B. Rouzeyre 80

Pipelined Test of SOC Cores through Test Data Transformations / O. Sinanoglu, A. Orailoglu 86

Test Resource Partitioning

Relating Entropy Theory to Test Data Compression / K. Balakrishnan, N. Touba 94

A Compression-Driven Test Access Mechanism Design Approach / P. Gonciari, B. Al-Hashimi 100

Fault Simulation and Verification

Enhanced 3-Valued Logic/Fault Simulation for Full Scan Circuits Using Implicit Logic Values / S. Kajihara, K. Saluja, S. Reddy 108

Signal Integrity Verification Using High Speed Monitors / V. Avendano, V. Champac, J. Figueras 114

Analog BIST

Towards a BIST Technique for Noise Figure Evaluation / M. Negreiros, L. Carro, A. Susin 122

A New BIST Scheme for 5GHz Low Noise Amplifiers / J.-Y. Ryu, B. Kim, I. Sylla 127

All-Pass SC Biquad Reconfiguration Scheme for Oscillation Based Analog BIST / U. Kac, F. Novak 133

Memory Testing

Dynamic Read Destructive Fault in Embedded-SRAMs: Analysis and March Test Solution / L. Dilillo, P. Girard, S. Pravossoudovitch, A. Virazel, S. Borri, M. Hage-Hassan 140

Tests for Address Decoder Delay Faults in RAMs Due to Inter-gate Opens / A. van de Goor, S. Hamdioui, Z. Al-Ars 146

ATPG and High-Level Test

Functional Fault Coverage: The Chamber of Secrets or an Accurate Estimation of Gate-Level Coverage? / F. Fummi, C. Marconcini, G. Pravadelli 154

Automatic Test Pattern Generation for Resistive Bridging Faults / P. Engelke, I. Polian, M. Renovell, B. Becker 160

Advances in DfT

A Design Methodology to Realize Delay Testable Controllers Using State Transition Information / T. Iwagaki, S. Ohtake, H. Fujiwara 168

An Efficient Scan Tree Design for Test Time Reduction / Y. Bonhomme, T. Yoneda, H. Fujiwara, P. Girard 174.

Notes:

Previous conferences entitled: European Test Workshop.

"IEEE Computer Society Order Number P2119"--T.p. verso.

Includes bibliographical references and author index.

ISBN:

0769521193

9780769521190

OCLC:

56673696

Access Restriction:

Restricted for use by site license.