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On wafer characterization. 63rd ARFTG conference digest : Spring, 2004 : 11 June, 2004, Fort Worth, TX / Automatic RF Techniques Group.

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Format:
Book
Conference/Event
Contributor:
IEEE Xplore (Online service)
Automatic RF Techniques Group.
Conference Name:
ARFTG Conference (63rd : 2004 : Fort Worth, Tex.)
Language:
English
Subjects (All):
Microwaves--Congresses.
Microwaves.
Radio frequency--Congresses.
Radio frequency.
Genre:
Conference papers and proceedings.
Physical Description:
x, 227 pages : illustrations
Other Title:
63rd ARFTG conference digest
ARFTG 63rd Conference, Spring 2004.
Place of Publication:
Piscataway, N.J. : IEEE, [2004]
System Details:
Mode of access: World Wide Web.
text file
Notes:
Cover title.
"IEEE Catalog Number: 04EX811"--T.p. verso.
Includes bibliographical references.
ISBN:
0780383710
9780780383715
OCLC:
57180808
Access Restriction:
Restricted for use by site license.

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