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2004 IEEE International Reliability Physics Symposium. 42nd Annual : Phoenix, Arizona, April 25-29, 2004 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.

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Format:
Book
Conference/Event
Contributor:
IEEE Xplore (Online service)
IEEE Electron Devices Society.
IEEE Reliability Society.
Conference Name:
International Reliability Physics Symposium (42nd : 2004 : Phoenix, Ariz.)
Language:
English
Subjects (All):
Semiconductors--Reliability--Congresses.
Semiconductors.
Integrated circuits--Reliability--Congresses.
Integrated circuits.
Electronic apparatus and appliances--Reliability--Congresses.
Electronic apparatus and appliances.
Semiconductors--Reliability.
Genre:
Conference papers and proceedings.
Physical Description:
xii, 748 pages : illustrations
Other Title:
IEEE International Reliability Physics Symposium
Reliability Physics Symposium proceedings, 2004, 42nd Annual, 2004 IEEE International.
Place of Publication:
Piscataway, N.J. : IEEE, [2004]
System Details:
Mode of access: World Wide Web.
text file
Notes:
"IEEE Catalog No. 04CH37533."
Includes bibliographical references.
ISBN:
078038315X
9780780383159
OCLC:
55768785
Access Restriction:
Restricted for use by site license.

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