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Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California / [edited by Tom Wik, Adit Singh, and Rochit Rajsuman] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid-State Circuits Society.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE International Workshop on Memory Technology, Design, and Testing (11th : 2003 : San Jose, Calif.)
- Language:
- English
- Subjects (All):
- Semiconductor storage devices--Testing--Congresses.
- Semiconductor storage devices.
- Random access memory--Congresses.
- Random access memory.
- Semiconductor storage devices--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- ix, 95 pages : illustrations
- Other Title:
- MTDT 2003
- Memory Technology, Design and Testing, 2003, records of the 2003 International Workshop on.
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society, [2003]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Computer Society Order Number PR02004"--T.p. verso.
- " ... the eleventh annual IEEE International Workshop ..."--P. vii.
- Includes bibliographical references and author index.
- ISBN:
- 0769520049
- 9780769520049
- OCLC:
- 55634022
- Access Restriction:
- Restricted for use by site license.
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