2 options
Proceedings International Test Conference 2003. [September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA / sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section].
- Format:
- Book
- Conference/Event
- Conference Name:
- International Test Conference (34th : 2003 : Charlotte, N.C.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Electronic digital computers--Circuits--Testing--Congresses.
- Electronic digital computers.
- Electronic digital computers--Circuits--Testing.
- Telecommunication--Congresses.
- Telecommunication.
- Radio frequency--Congresses.
- Radio frequency.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xvi, 1334 pages : illustrations
- Other Title:
- At head of title: ITC International Test Conference 2003
- Test Conference, 2003, proceedings, ITC 2003, International.
- Place of Publication:
- Washington, D.C. : International Test Conference ; Piscataway, N.J. : IEEE, [2003]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- Conference number inferred.
- "IEEE Catalog Number 03CH37494"--T.p. verso.
- Includes bibliographical references and author index.
- ISBN:
- 0780381068
- 9780780381063
- OCLC:
- 53187528
- Access Restriction:
- Restricted for use by site license.
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.