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21st IEEE VLSI Test Symposium. proceedings : 27 April-1 May, 2003, Napa Valley, California / sponsored by IEEE Computer Society Test Technology Technical Council.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE VLSI Test Symposium (21st : 2003 : Napa Valley, Calif.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Testing--Congresses.
- Integrated circuits.
- Integrated circuits--Very large scale integration--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xxvii, 432 pages : illustrations
- Other Title:
- Half t.p. title: VTS 2003
- VLSI Test Symposium, 2003, proceedings, 21st.
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society, [2003]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Computer Society Order Number PRO1924"--T.p. verso.
- Includes bibliographical references and author index.
- ISBN:
- 0769519245
- 9780769519241
- OCLC:
- 52272849
- Access Restriction:
- Restricted for use by site license.
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