2 options
Fourth International Symposium on Quality Electronic Design. proceedings : 24-26 March, 2003, San Jose, California / sponsored by, IEEE Electron Device Society (EDS) ... [and others].
Connect to full text Available online
View online- Format:
- Book
- Conference/Event
- Conference Name:
- International Symposium on Quality Electronic Design (4th : 2003 : San Jose, Calif.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Reliability--Congresses.
- Integrated circuits.
- Integrated circuits--Very large scale integration--Design and construction--Congresses.
- Integrated circuits--Very large scale integration--Design and construction.
- Integrated circuits--Very large scale integration--Computer-aided design--Congresses.
- Integrated circuits--Very large scale integration--Computer-aided design.
- Integrated circuits--Very large scale integration--Testing--Quality control--Congresses.
- Integrated circuits--Very large scale integration--Testing.
- Quality control.
- Integrated circuits--Very large scale integration--Reliability.
- Integrated circuits--Very large scale integration.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xxi, 457 pages : illustrations
- Other Title:
- ISQED 2003
- Quality electronic design
- Proceedings of the ISQED 2003
- ISQED proceedings 2003
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society, [2003]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Computer Society Order Number PR01881"--T.p. verso.
- Includes bibliographical references and author index.
- ISBN:
- 0769518818
- 9780769518817
- OCLC:
- 52003555
- Access Restriction:
- Restricted for use by site license.
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.