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2002 IEEE International Integrated Reliability Workshop. final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
- Format:
- Book
- Conference/Event
- Conference Name:
- International Integrated Reliability Workshop (2002 : Lake Tahoe, Calif.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Reliability--Congresses.
- Integrated circuits.
- Integrated circuits--Wafer-scale integration--Reliability--Congresses.
- Integrated circuits--Wafer-scale integration--Reliability.
- Integrated circuits--Wafer-scale integration.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- v, 214 pages : illustrations
- Other Title:
- Integrated Reliability Workshop Final Report, 2002, IEEE International.
- Place of Publication:
- Piscataway, N.J. : IEEE Society, [2002]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Catalog No. 02TH8634"--T.p. verso.
- Includes bibliographical references.
- ISBN:
- 0780375580
- 9780780375581
- OCLC:
- 51952817
- Access Restriction:
- Restricted for use by site license.
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