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Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. San Jose, CA, USA, March 9-11, 2004 / IEEE Components, Packaging, and Manufacturing Technology Society, National Institute of Standards and Technology.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE Semiconductor Thermal Measurement and Management Symposium (20th : 2004 : San Jose, Calif.)
- Language:
- English
- Subjects (All):
- Semiconductors--Thermal properties--Congresses.
- Semiconductors.
- Semiconductors--Cooling--Congresses.
- Semiconductors--Cooling.
- Semiconductors--Thermal properties.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xiv unnumbered pages, 313 pages : illustrations
- Other Title:
- Semiconductor Thermal Measurement and Management Symposium
- SEMI-THERM XX
- Semiconductor Thermal Measurement and Management, 2004 IEEE Twentieth Annual IEEE (SEMI-THERM)
- Place of Publication:
- Piscataway, N.J. : IEEE, [2004]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- " ... SEMI-THERM XX ... "p. iii.
- Cover title.
- "IEEE Catalog Number 04CH37545 Softbound Edition ; 04CD37545C CD-ROM Edition"--P. ii.
- Includes bibliographical references.
- ISBN:
- 078038363X
- 9780780383630
- 0780383648
- 9780780383647
- OCLC:
- 54797571
- Access Restriction:
- Restricted for use by site license.
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