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ICMTS 2003. proceedings of the 2003 International Conference on Microelectronic Test Structures : March 17-20, 2003, Double Tree Hotel, Monterey, California / sponsored by the IEEE Electron Devices Society.
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- Book
- Conference/Event
- Conference Name:
- IEEE International Conference on Microelectronic Test Structures (2003 : Monterey, Calif.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Semiconductors--Testing--Congresses.
- Semiconductors.
- Semiconductors--Testing.
- Electronic apparatus and appliances--Testing--Congresses.
- Electronic apparatus and appliances.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 249 pages : illustrations
- Other Title:
- 2003 IEEE International Conference on Microelectronic Test Structures
- Microelectronic test structures
- Microelectronic Test Structures, 2003, International Conference on.
- Place of Publication:
- Piscataway, N.J. : IEEE, [2003]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Catalog Number: 03CH37402"--T.p. verso.
- Includes bibliographical references and author index.
- ISBN:
- 0780376536
- 9780780376533
- OCLC:
- 52088222
- Access Restriction:
- Restricted for use by site license.
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