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Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. SEMI-THERM proceedings 2003 : San Jose, CA, USA, March 11-13, 2003 / IEEE Components, Packaging, and Manufacturing Technology Society.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE Semiconductor Thermal Measurement and Management Symposium (19th : 2003 : San Jose, Calif.)
- Language:
- English
- Subjects (All):
- Semiconductors--Thermal properties--Congresses.
- Semiconductors.
- Semiconductors--Cooling--Congresses.
- Semiconductors--Cooling.
- Semiconductors--Thermal properties.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xiv unnumbered pages, 404 pages : illustrations
- Other Title:
- Semiconductor Thermal Measurement and Management Symposium
- SEMI-THERM proceedings 2003
- Semiconductor Thermal Measurement and Management Symposium, 2003, Ninteenth Annual IEEE.
- Place of Publication:
- Piscataway, N.J. : IEEE, [2003]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- Cover title.
- "IEEE Catalog Number 02CH37437 Softbound Edition ; 02CD37437C CD-ROM Edition"--Verso of T.p. verso.
- Includes bibliographical references.
- ISBN:
- 0780377931
- 9780780377936
- 078037794X
- 9780780377943
- OCLC:
- 51952764
- Access Restriction:
- Restricted for use by site license.
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