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2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. proceedings : 24-26 October, 2001, San Francisco, California / sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Committee.
Connect to full text Available online
View online- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2001 : San Francisco, Calif.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Design and construction--Congresses.
- Integrated circuits.
- Integrated circuits--Very large scale integration--Design and construction.
- Fault-tolerant computing--Congresses.
- Fault-tolerant computing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xiii, 468 pages : illustrations
- Other Title:
- International Symposium on Defect and Fault Tolerance in VLSI Systems
- Defect and fault tolerance in VLSI systems
- Half t.p. title: DFT 2001
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society Press, [2001]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Computer Society Order Number PR01203"--T.p. verso.
- Includes bibliographical references and author index.
- ISBN:
- 0769512038
- 9780769512037
- 0769512046
- 9780769512044
- 0769512054
- 9780769512051
- OCLC:
- 48385984
- Access Restriction:
- Restricted for use by site license.
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