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New applications in modelling and inversion techniques for non-destructive testing. colloquium : Friday, 29 January 1999 / IEE Science, Education and Technology.

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Format:
Book
Contributor:
IEEE Xplore (Online service)
Institution of Electrical Engineers. Professional Group S6 (Non-destructive Testing and Evaluation)
Institution of Electrical Engineers. Science, Education, and Technology Division.
Series:
Colloquium (Institution of Electrical Engineers) ; no. 99/020.
Ref ; 99/020
Language:
English
Subjects (All):
Nondestructive testing--Congresses.
Nondestructive testing.
Reliability (Engineering)--Congresses.
Reliability (Engineering).
Genre:
Conference papers and proceedings.
Physical Description:
1 volume (various pagings) : illustrations.
Place of Publication:
London : Institution of Electrical Engineers, [1999]
System Details:
Mode of access: World Wide Web.
text file
Notes:
Cover title.
"Professional Group S6 (Non-destructive testing and evaluation)"--Introd.
Includes bibliographical references.
OCLC:
44413122
Access Restriction:
Restricted for use by site license.

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