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Colloquium on "Mixed Signal VLSI Test". on Monday, 13 December 1993 / organised by Professional Groups E3 (Microelectronics and Semiconductor Devices) and E10 (Circuits and Systems).

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Format:
Book
Conference/Event
Contributor:
IEEE Xplore (Online service)
Institution of Electrical Engineers. Professional Group E3 (Microelectronics and semiconductor devices)
Institution of Electrical Engineers. Professional Group E10 (Circuit Theory and Design)
Institution of Electrical Engineers. Electronics Division.
Conference Name:
Colloquium on "Mixed Signal VLSI Test" (1993 : London, England)
Series:
Colloquium (Institution of Electrical Engineers) ; no. 93/240.
IEE colloquium ; digest no. 1993/240
Language:
English
Subjects (All):
Integrated circuits--Very large scale integration--Testing--Congresses.
Integrated circuits.
Mixed signal circuits--Testing--Congresses.
Mixed signal circuits.
Mixed signal circuits--Testing.
Integrated circuits--Very large scale integration--Testing.
Genre:
Conference papers and proceedings.
Physical Description:
1 volume (various pagings) : illustrations.
Other Title:
Electronics Division Colloquium on "Mixed Signal VLSI Test"
Mixed Signal VLSI Test, IEE Colloquium on.
Place of Publication:
London : Institution of Electrical Engineers, 1993.
System Details:
Mode of access: World Wide Web.
text file
Notes:
At head of title: Electronics Division.
Cover title.
OCLC:
35543236
Access Restriction:
Restricted for use by site license.

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