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Colloquium on "Application and Development of the Boundary-Scan Standard". on Wednesday, 19 December 1990 / organised by Professional Group C6 (Electronic Manufacturing Systems Technology).
IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online
IEEE Xplore (IEEE/IET Electronic Library - IEL)- Format:
- Book
- Conference/Event
- Conference Name:
- Colloquium on "Application and Development of the Boundary-Scan Standard" (1990 : London, England)
- Series:
- Colloquium (Institution of Electrical Engineers) ; no. 90/183.
- IEE colloquium ; digest no. 1990/183
- Language:
- English
- Subjects (All):
- Boundary scan testing--Congresses.
- Boundary scan testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 1 volume (various pagings) : illustrations.
- Other Title:
- Computing and Control Division Colloquium on "Application and Development of the Boundary-Scan Standard"
- Application and Development of the Boundary-Scan Standard, IEE Colloquium on.
- Place of Publication:
- London : Institution of Electrical Engineers, 1990.
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- At head of title: Computing and Control Division.
- Cover title.
- OCLC:
- 35507223
- Access Restriction:
- Restricted for use by site license.
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