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Custom VLSI design and test. 31 October 1988 / organised by Professional Groups E3 (Microelectronics and Semiconductor Devices) and E10 (Circuit Theory and Design).
Connect to full text Available online
View online- Format:
- Book
- Series:
- Colloquium (Institution of Electrical Engineers) ; no. 88/110.
- IEE colloquium ; digest no. 1988/110
- Language:
- English
- Subjects (All):
- Integrated circuits--Congresses.
- Integrated circuits.
- Integrated circuits--Verification--Congresses.
- Integrated circuits--Verification.
- Integrated circuits--Very large scale integration--Congresses.
- Integrated circuits--Very large scale integration.
- Application-specific integrated circuits--Congresses.
- Application-specific integrated circuits.
- Computer-aided design--Congresses.
- Computer-aided design.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 1 volume (various pagings) : illustrations.
- Place of Publication:
- London : Institution of Electrical Engineers, 1988.
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- At head of title: Electronics Division.
- Cover title.
- OCLC:
- 35481722
- Access Restriction:
- Restricted for use by site license.
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