2 options
2000 IEEE International Integrated Reliability Workshop final report. Stanford Sierra Camp, Lake Tahoe, California, October 23-26, 2000 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
- Format:
- Book
- Conference/Event
- Conference Name:
- International Integrated Reliability Workshop (2000 : Lake Tahoe, Calif.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Reliability--Congresses.
- Integrated circuits.
- Integrated circuits--Wafer-scale integration--Reliability--Congresses.
- Integrated circuits--Wafer-scale integration--Reliability.
- Integrated circuits--Wafer-scale integration.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- vii, 199 pages : illustrations
- Other Title:
- 2000 IRW final report
- IEEE International Integrated Reliability Workshop final report
- Integrated Reliability Workshop Final Report, 2000 IEEE International.
- Place of Publication:
- Piscataway, NJ : IEEE Electron Devices Society : IEEE Reliability Society, [2000]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- Includes bibliographical references.
- "IEEE Catalog No. 00TH8515."
- ISBN:
- 0780363922
- 9780780363922
- OCLC:
- 45913793
- Access Restriction:
- Restricted for use by site license.
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.