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2000 GaAs Reliability Workshop. proceedings : November 5, 2000, Seattle, Washington / sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Devices Society of the Institute of Electrical and Electronics Engineers, Inc.
- Format:
- Book
- Conference/Event
- Conference Name:
- GaAs Reliability Workshop (2000 : Seattle, Wash.)
- Language:
- English
- Subjects (All):
- Gallium arsenide semiconductors--Congresses.
- Gallium arsenide semiconductors.
- Semiconductors--Reliability--Congresses.
- Semiconductors.
- Semiconductors--Materials--Congresses.
- Semiconductors--Materials.
- Semiconductors--Reliability.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- vii, 224 pages : illustrations
- Place of Publication:
- Piscataway, N.J. : IEEE, [2000]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Catalog Number: 00TH8513"--T.p. verso.
- Includes bibliographical references.
- ISBN:
- 0790801027
- 9780790801025
- 0780350677
- 9780780350670
- OCLC:
- 45711920
- Access Restriction:
- Restricted for use by site license.
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