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2000 GaAs Reliability Workshop. proceedings : November 5, 2000, Seattle, Washington / sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Devices Society of the Institute of Electrical and Electronics Engineers, Inc.

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Format:
Book
Conference/Event
Contributor:
IEEE Xplore (Online service)
JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards.
IEEE Electron Devices Society.
Conference Name:
GaAs Reliability Workshop (2000 : Seattle, Wash.)
Language:
English
Subjects (All):
Gallium arsenide semiconductors--Congresses.
Gallium arsenide semiconductors.
Semiconductors--Reliability--Congresses.
Semiconductors.
Semiconductors--Materials--Congresses.
Semiconductors--Materials.
Semiconductors--Reliability.
Genre:
Conference papers and proceedings.
Physical Description:
vii, 224 pages : illustrations
Place of Publication:
Piscataway, N.J. : IEEE, [2000]
System Details:
Mode of access: World Wide Web.
text file
Notes:
"IEEE Catalog Number: 00TH8513"--T.p. verso.
Includes bibliographical references.
ISBN:
0790801027
9780790801025
0780350677
9780780350670
OCLC:
45711920
Access Restriction:
Restricted for use by site license.

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