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2000 5th International Workshop on Statistical Metrology. IWSM, June 11, 2000, Hawaii.
- Format:
- Book
- Conference/Event
- Conference Name:
- International Workshop on Statistical Metrology (5th : 2000 : Hawaii)
- Language:
- English
- Subjects (All):
- Semiconductors--Characterization--Statistical methods--Congresses.
- Semiconductors.
- Semiconductors--Measurement--Congresses.
- Semiconductors--Measurement.
- Semiconductors--Characterization.
- Statistics.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 83 pages : illustrations
- Place of Publication:
- Piscataway, NJ : IEEE Electron Devices Society, [2000]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Cat. No. 00TH8489"--T.p. verso.
- Includes bibliographical references.
- ISBN:
- 0780358961
- 9780780358966
- OCLC:
- 45011747
- Access Restriction:
- Restricted for use by site license.
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