2 options
2000 IEEE International Workshop on Defect Based Testing. April 30, 2000, Montreal, Canada : proceedings / sponsored by IEEE Computer Society Test Technology Technical Committee ; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon.
Connect to full text Available online
View online- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE International Workshop on Defect Based Testing (2000 : Montréal, Québec)
- IEEE VLSI Test Symposium (2000 : Montréal, Québec)
- Language:
- English
- Subjects (All):
- Integrated circuits--Defects--Congresses.
- Integrated circuits.
- Iddq testing--Congresses.
- Iddq testing.
- Metal oxide semiconductors, Complementary--Congresses.
- Metal oxide semiconductors, Complementary.
- Integrated circuits--Defects.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- ix, 82 pages : illustrations
- Other Title:
- Digest of papers, IEEE International Workshop on Defect Based Testing, DBT 2000
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society, [2000]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Catalog Number PR00637"--P. [4] of cover.
- Includes bibliographical references and index.
- ISBN:
- 0769506372
- 9780769506371
- OCLC:
- 44935580
- Access Restriction:
- Restricted for use by site license.
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.