2 options
Proceedings / International Workshop on Memory Technology, Design and Testing, August 24-25, 1998, San Jose, Calif., USA ; sponsored by IEEE Computer Society, Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuit[s] Society ; edited by D. Lepejian ... [and others].
Connect to full text Available online
View online- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE International Workshop on Memory Technology, Design, and Testing (1998 : San Jose, Calif.)
- Language:
- English
- Subjects (All):
- Semiconductor storage devices--Testing--Congresses.
- Semiconductor storage devices.
- Random access memory--Congresses.
- Random access memory.
- Semiconductor storage devices--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- ix, 131 pages : illustrations
- Other Title:
- Records of the IEEE International Workshop on Memory Technology, Design and Testing
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society, 1999.
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Computer Society Order Number PR08494"--T.p. verso.
- "IEEE Order Plan Catalog Number 98TB100236"--T.p. verso.
- Includes bibliographical references and index.
- ISBN:
- 0818684941
- 9780818684944
- 0818684968
- 9780818684968
- ISSN:
- 1087-4852
- OCLC:
- 44775240
- Access Restriction:
- Restricted for use by site license.
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.