6th IEEE International On-Line Testing Workshop. proceedings : July 3-5, 2000, Palma De Mallorca, Spain / sponsored by IEEE Computer Society Test Technology Technical Council, in cooperation with University of Illes Balears.

Format:

Book

Conference/Event

Contributor:

IEEE Xplore (Online service)

IEEE Computer Society. Technical Council on Test Technology.

Conference Name:

IEEE International On-Line Testing Workshop (6th : 2000 : Palma de Mallorca, Spain)

Language:

English

Subjects (All):

Electronic circuits--Testing--Data processing--Congresses.

Electronic circuits.

Error-correcting codes (Information theory)--Congresses.

Error-correcting codes (Information theory).

Electronic circuits--Testing--Data processing.

Electronic circuits--Testing.

Genre:

Conference papers and proceedings.

Physical Description:

x, 220 pages : illustrations

Place of Publication:

Los Alamitos, Calif. : IEEE Computer Society, [2000]

System Details:

Mode of access: World Wide Web.

text file

Contents:

Dependability Issues in the WWW / Jacob Abraham

Session 1 Fault Tolerance

Micro-Checkpointing: Checkpointing for Multithreaded Applications / K. Whisnant, Z. Kalbarczyk, R. Iyer 3

A COTS Wrapping Toolkit for Fault Tolerant Applications under Windows NT / A. Benso, S. Chiusano, P. Prinetto 9

Evaluating the Effectiveness of a Software Fault-Tolerance Technique on RISC- and CISC-Based Architectures / M. Rebaudengo, M. Sonza Reorda, M. Violante, P. Cheynet, B. Nicolescu, R. Velazco 17

Session 2 Fault Tolerance and On-Line Testing for Reconfigurable Systems

Relation between Fault Tolerance and Reconfiguration in Cellular Systems / L. Sekanina, V. Drabek 25

Improving On-Line BIST-Based Diagnosis for Roving STARs / M. Abramovici, C. Stroud, B. Skaggs, J. Emmert 31

Self-Testing of FPGA Delay Faults in the System Environment / A. Krasniewski 40

Session 3 Reliability Issues in Nanometer Technologies and Radiation Effects

A Crosstalk Sensor Implementation for Measuring Interferences in Digital CMOS VLSI Circuits / J. Sainz, M. Roca, R. Munoz, J. Maiz, L. Aguado 45

An Overview of the Applications of a Pulsed Laser System for SEU Testing / V. Pouget, P. Fouillat, D. Lewis, H. Lapuyade, L. Sarger, F. Roche, S. Duzellier, R. Ecoffet 52

Session 4 Fault Injection

New Techniques for Accelerating Fault Injection in VHDL Descriptions / B. Parrotta, M. Rebaudengo, M. Sonza Reorda, M. Violante 61

Estimating Circuit Fault-Tolerance by Means of Transient-Fault Injection in VHDL / F. Vargas, A. Amory, R. Velazco 67

A Study of the Effects of Transient Fault Injection into the VHDL Model of a Fault-Tolerant Microcomputer System / D. Gil, J. Gracia, J. Baraza, P. Gil 73

Transient Bitflip Injection in Microprocessor Embedded Applications / R. Velazco, S. Rezgui 80

Session 5 On-Line Current Monitoring

On-Line Current Testing for a Microprocessor Based Application with an Off-Chip Sensor / B. Alorda, I. de Paul, J. Segura, T. Miller 87

I-V Fast I[subscript DDQ] Current Sensor for On-Line Mixed-Signal/Analog Test / M. Margala, S. Dragic, A. Elabasiry, S. Ekpe, V. Stopjakova 92

A Compact Built-In Current Sensor for I[subscript DDQ] Testing / Y. Tsiatouhas, Th. Haniotakis, D. Nikolos 95

An Improved CMOS BICS for On-Line Testing / Y. Maidon, Y. Deval, J. Begueret 100

Session 6 Concurrent Checking

Concurrent Scan Monitoring and Multi-Pattern Search / J. dos Santos 107

Analytical Redundancy Based Approach for Concurrent Fault Detection in Linear Digital Systems / A. Abdelhay, E. Simeu 112

Decomposition Approach to Designing FPGA-Based Self-Checking Control Units / M. Karpovsky, I. Levin, V. Sinelnikov

Session 7 Built-in Self Testing

Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-At and Bridging Faults / P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel 121

On Using Deterministic Test Sets in BIST / O. Novak, J. Nosek 127

Power Reduction in Test-Per-Scan BIST / X. Zhang, K. Roy 133

Panel Session: Defect Driven Testing: IDDX and What Else?

Session 8 Self Checking Circuits and Analog Approaches

New Self-Checking Circuits by Use of Berger-Codes / A. Morozov, V. Saposhnikov, Vl. Saposhnikov, M. Gossel 141

A New Method for Concurrent Checking by Use of a 1-out-of-4 Code / M. Gossel, Vl. Saposhnikov, A. Dmitiriev, V. Saposhnikov 147

Self-Checking FSM Design with Observing Only FSM Outputs / A. Matrosova, S. Ostanin 153

Faster Time-to-Market, Lower Cost of Development and Test for Standard Analog IC / P. Migliavacca 155

Session 9 Coding Theory and Applications

Theoretical Performance Bounds of a Probability of Bit Error Estimator Used in Digital Links Employing Binary Block Codes / K. Jagath-Kumara 165

A Stamping Technique to Increase the Error Correction Capacity of the (127,k,d) RS Code / T. Vallino, A. Dandache, F. Monteiro, B. Lepley, J. Delahaye 169

Low Cost Concurrent Error Detection Based on Modulo Weight-Based Codes / D. Das, N. Touba, M. Seuring, M. Gossel 171

Session 10 Fault Tolerance and On-Line Testing in Railway and Industrial Control

A Very Flexible DSP-Based Controller for On-Line Test and Control of Industrial Processes / M. Nillesen, A. Del Pizzo, M. Pasquariello, R. Rizzo 179

On Realization of Fault-Tolerant Fuzzy Controllers / N. Kamiura, M. Tomita, T. Isokawa, N. Matsui 185

ISIS: A Fail-Safe Interface Realized in Smart Power Technology / M. Nicolaidis, N. Zaidan, T. Calin, D. Bied-Charreton 191

Session 11 On-Line Testing and Self Repair

High-Level Synthesis Methodology for On-Line Testability Optimization / M. Naal, E. Simeu 201

Improving Fault Coverage in System Tests / J. Sosnowski 207

A Family of Self-Repair SRAM Cores / A. Benso, S. Chiusano, G. Di Natale, P. Prinetto, M. Lobetti Bodoni 214.

Notes:

Includes bibliographical references and index.

ISBN:

0769506461

9780769506463

OCLC:

44624701

Access Restriction:

Restricted for use by site license.