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Proceedings, IEEE Workshop on Multi-View Modeling & Analysis of Visual Scenes (MVIEW'99). June 26, 1999 Fort Collins, Colorado / sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence.
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- Book
- Conference/Event
- Conference Name:
- IEEE Workshop on Multi-View Modeling & Analysis of Visual Scenes (1999 : Fort Collins, Colo.)
- Language:
- English
- Subjects (All):
- Image processing--Digital techniques--Congresses.
- Image processing.
- Image processing--Digital techniques.
- Image analysis--Congresses.
- Image analysis.
- Stereoscopic views--Congresses.
- Stereoscopic views.
- Image reconstruction--Congresses.
- Image reconstruction.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- vii, 89 pages : illustrations
- Other Title:
- IEEE Workshop on Multi-View Modeling & Analysis of Visual Scenes
- MVIEW'99
- 1999 IEEE Workshop on Multi-View Modeling and Analysis of Visual Scenes
- Multi-View Modeling and Analysis of Visual Scenes, 1999, (MVIEW '99) proceedings, IEEE Workshop on.
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society, [1999]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- Includes bibliographical references and index.
- ISBN:
- 0769501109
- 9780769501109
- OCLC:
- 43954259
- Access Restriction:
- Restricted for use by site license.
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