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Proceedings, International Test Conference 1999.
- Format:
- Book
- Conference/Event
- Conference Name:
- International Test Conference (30th : 1999 : Atlantic City, N.J.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Electronic digital computers--Circuits--Testing--Congresses.
- Electronic digital computers.
- Electronic digital computers--Circuits--Testing.
- Embedded computer systems--Testing--Congresses.
- Embedded computer systems.
- Microprocessors--Testing--Congresses.
- Microprocessors.
- Microprocessors--Testing.
- Embedded computer systems--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xiv, 1163 pages : illustrations
- Other Title:
- Proceedings : International Test Conference 1999
- 1999 IEEE International Test Conference
- IEEE International Test Conference
- International Test Conference 1999
- International Test Conference
- Test Conference, 1999, proceedings, International.
- Place of Publication:
- Washington, D.C. : International Test Conference ; Piscataway, NJ : IEEE Service Center, [1999]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- Proceedings of the 30th ITC Conference held Sept. 28-30, 1999 in Atlantic City, N.J., sponsored by IEEE Computer Society.
- "IEEE Catalog Number 99CH37034"--T.p. verso.
- Includes bibliographical references and index.
- ISBN:
- 0780357531
- 9780780357532
- 078035754X
- 9780780357549
- 0780357558
- 9780780357556
- OCLC:
- 42971776
- Access Restriction:
- Restricted for use by site license.
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