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1998 GaAs Reliability Workshop. proceedings : November 1, 1998, Atlanta, Georgia / sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; in cooperation with the Electron Devices Society of the Institute of Electrical and Electronics Engineers, Inc.

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Format:
Book
Conference/Event
Contributor:
IEEE Xplore (Online service)
JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards.
IEEE Electron Devices Society.
Conference Name:
GaAs Reliability Workshop (1998 : Atlanta, Ga.)
Language:
English
Subjects (All):
Gallium arsenide semiconductors--Congresses.
Gallium arsenide semiconductors.
Semiconductors--Reliability--Congresses.
Semiconductors.
Semiconductors--Materials--Congresses.
Semiconductors--Materials.
Semiconductors--Reliability.
Genre:
Conference papers and proceedings.
Physical Description:
vii, 105 pages : illustrations
Place of Publication:
[Piscataway, N.J.] : [IEEE], [1998]
System Details:
Mode of access: World Wide Web.
text file
Summary:
The 1998 GaAs Reliability Workshop brings together researchers, manufacturers and users of GaAs devices and presents the latest results and new developments in all phases of GaAs reliability of control applications is emphasized with an increasing interest in the theoretical aspects and a general area of hybrid techniques.
Notes:
"IEEE Catalog Number: 98EX219"--T.p. verso.
Includes bibliographical references.
ISBN:
0790800659
9780790800653
0780350677
9780780350670
OCLC:
41428937
Access Restriction:
Restricted for use by site license.

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