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IWSM. 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu / [sponsored by] IEEE Electron Devices Society.
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- Book
- Conference/Event
- Conference Name:
- International Workshop on Statistical Metrology (3rd : 1998 : Honolulu, Hawaii)
- Language:
- English
- Subjects (All):
- Semiconductors--Characterization--Statistical methods--Congresses.
- Semiconductors.
- Semiconductors--Measurement--Congresses.
- Semiconductors--Measurement.
- Semiconductors--Characterization.
- Statistics.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- vi, 121 pages : illustrations
- Other Title:
- Workshop on statistical metrology
- Statistical metrology
- Statistical Metrology, 1998, 3rd International Workshop on.
- Place of Publication:
- Piscataway, N.J. : IEEE ; Gaithersburg, Md. : Widerkehr and Associates, [1998]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Catalog Number 98EX113"--T.p. verso.
- Includes bibliographical references.
- ISBN:
- 0780343387
- 9780780343382
- 0780343395
- 9780780343399
- OCLC:
- 40383319
- Access Restriction:
- Restricted for use by site license.
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