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Defect and fault tolerance in VLSI systems. proceedings : 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : November 2-4, 1998, Austin, Texas / sponsored by the IEEE Computer Society, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Committee.
Connect to full text Available online
View online- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (1998 : Austin, Tex.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Design and construction--Congresses.
- Integrated circuits.
- Integrated circuits--Very large scale integration--Design and construction.
- Fault-tolerant computing--Congresses.
- Fault-tolerant computing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xi, 355 pages : illustrations
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society Press, [1998]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "[IEEE Computer Society Press Order Number] PR8832"--T.p. verso.
- "IEEE Catalog Number 98EX223"--T.p. verso.
- Includes bibliographical references and author index.
- ISBN:
- 0818688327
- 9780818688324
- 0818688351
- 9780818688355
- OCLC:
- 40340779
- Access Restriction:
- Restricted for use by site license.
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