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Proceedings. 1997 GaAs Reliability Workshop : October 12, 1997, Anaheim, California / sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; in cooperation with the Electron Device Society of the Institute of Electrical and Electronics Engineers, Inc.
- Format:
- Book
- Conference/Event
- Conference Name:
- GaAs Reliability Workshop (1997 : Anaheim, Calif.)
- Language:
- English
- Subjects (All):
- Gallium arsenide semiconductors--Reliability--Congresses.
- Gallium arsenide semiconductors.
- Bipolar transistors--Reliability--Congresses.
- Bipolar transistors.
- Accelerated life testing--Congresses.
- Accelerated life testing.
- Bipolar transistors--Reliability.
- Gallium arsenide semiconductors--Reliability.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- v, 116 pages : illustrations
- Other Title:
- GaAs Reliability Workshop, 1997, proceedings.
- Place of Publication:
- [Arlington, VA] : [IEEE], [1998]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE catalog number: 97TH8340"--Cover p. [2].
- Includes bibliographical references.
- ISBN:
- 0790800640
- 9780790800646
- 0780343131
- 9780780343139
- OCLC:
- 40143148
- Access Restriction:
- Restricted for use by site license.
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