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16th IEEE VLSI Test Symposium. proceedings : April 26-30, 1998, Monterey, California / sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section.
IEEE Xplore (IEEE/IET Electronic Library - IEL) Available online
IEEE Xplore (IEEE/IET Electronic Library - IEL)- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE VLSI Test Symposium (16th : 1998 : Monterey, Calif.)
- Language:
- English
- Subjects (All):
- Integrated circuits--Very large scale integration--Testing--Congresses.
- Integrated circuits.
- Integrated circuits--Very large scale integration--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xxxv, 472 pages : illustrations
- Other Title:
- VLSI Test Symposium
- VLSI Test Symposium, 1998, proceedings, 16th IEEE.
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society Press, [1998]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Computer Society Order Number PR08436--T.p. verso.
- "IEEE Order Plan Catalog Number 98TB100231"--T.p. verso.
- Includes bibliographical references and author index.
- ISBN:
- 0818684364
- 9780818684364
- 0818684380
- 9780818684388
- OCLC:
- 39141287
- Access Restriction:
- Restricted for use by site license.
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