16th IEEE VLSI Test Symposium. proceedings : April 26-30, 1998, Monterey, California / sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section.

Format:

• Book
• Conference/Event

Contributor:

• IEEE Xplore (Online service)
• IEEE Computer Society. Test Technology Technical Committee.
• Institute of Electrical and Electronics Engineers. Philadelphia Section.

Conference Name:

• IEEE VLSI Test Symposium (16th : 1998 : Monterey, Calif.)

Language:

English

Subjects (All):

• Integrated circuits--Very large scale integration--Testing--Congresses.
• Integrated circuits--Very large scale integration--Testing.

Genre:

• Conference papers and proceedings.

Physical Description:

xxxv, 472 pages : illustrations

Other Title:

• VLSI Test Symposium
• VLSI Test Symposium, 1998, proceedings, 16th IEEE.

Place of Publication:

Los Alamitos, Calif. : IEEE Computer Society Press, [1998]

System Details:

• Mode of access: World Wide Web.
• text file

Notes:

• "IEEE Computer Society Order Number PR08436--T.p. verso.
• "IEEE Order Plan Catalog Number 98TB100231"--T.p. verso.
• Includes bibliographical references and author index.

ISBN:

• 0818684364
• 9780818684364
• 0818684380
• 9780818684388

OCLC:

39141287

Access Restriction:

Restricted for use by site license.