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IEEE International Workshop on IDDQ Testing. digest of papers, November 5-6, 1997, Washington, D.C. / edited by Anura P. Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE International Workshop on IDDQ Testing (3rd : 1997 : Washington, D.C.)
- Language:
- English
- Subjects (All):
- Iddq testing--Congresses.
- Iddq testing.
- Metal oxide semiconductors, Complementary--Testing--Congresses.
- Metal oxide semiconductors, Complementary.
- Metal oxide semiconductors, Complementary--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- ix, 119 pages : illustrations
- Other Title:
- IDDQ testing
- IDDQ Testing, 1997, digest of papers, IEEE International Workshop on.
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society Press, [1997]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Computer Society order number PR08123"--T.p. verso.
- "IEEE order plan catalog number 97TB100169"--T.p. verso.
- Includes bibliographical references and index.
- ISBN:
- 0818681233
- 9780818681233
- 081868125X
- 9780818681257
- OCLC:
- 38107699
- Access Restriction:
- Restricted for use by site license.
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