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Proceedings [of the] Sixth Asian Test Symposium. (ATS'97) : November 17-19, 1997, Akita, Japan / sponsored by the IEEE Computer Society, Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [and others].
- Format:
- Book
- Conference/Event
- Conference Name:
- Asian Test Symposium (6th : 1997 : Akita, Japan)
- Language:
- English
- Subjects (All):
- Electronic digital computers--Circuits--Testing--Congresses.
- Electronic digital computers.
- Electronic digital computers--Circuits--Testing.
- Electronic circuits--Testing--Congresses.
- Electronic circuits.
- Fault-tolerant computing--Congresses.
- Fault-tolerant computing.
- Electronic circuits--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xv, 417 pages : illustrations
- Other Title:
- ATS'97
- ATS '97
- Test Symposium, 1997, (ATS '97) proceedings, Sixth Asian.
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society Press, [1997]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE catalog number 97TB100205"--T.p. verso.
- Includes bibliographical references and author.
- ISBN:
- 0818682094
- 9780818682094
- 0818682116
- 9780818682117
- OCLC:
- 38062298
- Access Restriction:
- Restricted for use by site license.
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