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1997 IEEE International Reliability Physics symposium proceedings. 35th annual, Denver, Colorado, April 8, 9, 10, 1997 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
- Format:
- Book
- Conference/Event
- Conference Name:
- International Reliability Physics Symposium (35th : 1997 : Denver, Colo.)
- Language:
- English
- Subjects (All):
- Electronic apparatus and appliances--Reliability--Congresses.
- Electronic apparatus and appliances.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- vi, 384 pages : illustrations
- Other Title:
- 1997 IEEE Annual International Reliability Physics
- IEEE International Reliability Physics proceedings
- Reliability Physics Symposium, 1997, 35th annual proceedings, IEEE International.
- Place of Publication:
- Piscataway, N.J. : Institute of Electrical and Electronics Engineers, [1997]
- System Details:
- Mode of access: World Wide Web.
- text file
- Summary:
- These papers deal with physical mechanisms that effect the reliability or performance of integrated circuits and microelectronic devices. Original work is presented that identifies failure or degradation mechanisms, insight into existing failure mechanisms, innovative analytic techniques, and ways to build in reliability. Improvements in yield factors are reported.
- Notes:
- "IEEE catalog no. 97CH35983."
- Includes bibliographical references.
- ISBN:
- 0780335759
- 9780780335752
- 0780335767
- 9780780335769
- 0780335775
- 9780780335776
- OCLC:
- 36888308
- Access Restriction:
- Restricted for use by site license.
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