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Proceedings. International Test Conference 1996.
- Format:
- Book
- Conference/Event
- Conference Name:
- International Test Conference (1996 : Washington, D.C)
- Language:
- English
- Subjects (All):
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Electronic digital computers--Circuits--Testing--Congresses.
- Electronic digital computers.
- Electronic digital computers--Circuits--Testing.
- Integrated circuits--Fault tolerance--Congresses.
- Integrated circuits--Fault tolerance.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- xii, 951 pages : illustrations
- Other Title:
- Test and design validity
- Test Conference, 1996, proceedings, International.
- Place of Publication:
- Altoona, Pa. : The Conference, [1996]
- System Details:
- Mode of access: World Wide Web.
- text file
- Summary:
- ITC is the World's largest premier technical conference on the testing and total quality of integrated electronics and the assenblies and systems that are based on them.
- Notes:
- "Sponsored by IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section"--Cover.
- "October 20-25, 1996 ... Washington, D.C., USA"--Cover.
- "IEEE catalog number 96CH35976"--T.p. verso.
- Includes bibliographical references and index.
- ISBN:
- 0780335414
- 9780780335417
- 0780335406
- 9780780335400
- 0780335422
- 9780780335424
- 0780335430
- 9780780335431
- OCLC:
- 36364229
- Access Restriction:
- Restricted for use by site license.
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