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Digest of papers. 1996 IEEE International Workshop on IDDQ Testing, October 24-25, 1996, Washington, D.C. / edited by Carol Tong, Anura Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology.
- Format:
- Book
- Conference/Event
- Conference Name:
- IEEE International Workshop on IDDQ Testing (1996 : Washington, D.C.)
- Language:
- English
- Subjects (All):
- Iddq testing--Congresses.
- Iddq testing.
- Metal oxide semiconductors, Complementary--Testing--Congresses.
- Metal oxide semiconductors, Complementary.
- Metal oxide semiconductors, Complementary--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- ix, 105 pages : illustrations
- Other Title:
- 1996 IEEE International Workshop on IDDQ Testing
- IEEE International Workshop on IDDQ Testing
- IDDQ 96
- IDDQ Testing, 1996, IEEE International Workshop on.
- Place of Publication:
- Los Alamitos, Calif. : IEEE Computer Society Press, [1996]
- System Details:
- Mode of access: World Wide Web.
- text file
- Notes:
- "IEEE Computer Society Press order number PR07655"--T.p. verso.
- "IEEE order plan catalog number 96TB100067"--T.p. verso.
- Includes bibliographical references.
- ISBN:
- 0818676558
- 9780818676550
- 0818676574
- 9780818676574
- OCLC:
- 35911770
- Access Restriction:
- Restricted for use by site license.
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