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Proceedings of the Fifth Asian Test Symposium. ATS '96 : November 20-22, 1996, Hsinchu, Taiwan / sponsored by the IEEE Computer Society Technical Committee on Test Technology -- Asia Subcommittee, National Tsing Hua University.

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Format:
Book
Conference/Event
Contributor:
IEEE Xplore (Online service)
IEEE Computer Society. Test Technology Technical Committee.
Guo li qing hua da xue (Hsinchu City, Taiwan)
Conference Name:
Asian Test Symposium (5th : 1996 : Hsinchu, Taiwan)
Language:
English
Subjects (All):
Electronic digital computers--Circuits--Testing--Congresses.
Electronic digital computers.
Electronic digital computers--Circuits--Testing.
Electronic circuits--Testing--Congresses.
Electronic circuits.
Fault-tolerant computing--Congresses.
Fault-tolerant computing.
Electronic circuits--Testing.
Genre:
Conference papers and proceedings.
Physical Description:
xviii, 306 pages : illustrations
Other Title:
ATS '96
Test Symposium, 1996, proceedings of the Fifth Asian.
Place of Publication:
Los Alamitos, Calif. : IEEE Computer Society Press, [1996]
System Details:
Mode of access: World Wide Web.
text file
Notes:
"IEEE order plan catalog number 96TB100072"--T.p. verso.
"IEEE Computer Society Press order number PR07478."
Includes bibliographical references and index.
ISBN:
0818674784
9780818674785
0818674806
9780818674808
OCLC:
35870230
Access Restriction:
Restricted for use by site license.

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